SURFACE PHOTOVOLTAGE ANALYSIS OF PHOTOACTIVE MATERIALS

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Surface photovoltage (SPV) techniques provide information about photoactive materials with respect to charge separation in space. This book aims to share experience in measuring and analyzing SPV signals and addresses researchers and developers interested in learning more about and in applying SPV methods. For this purpose, basics about processes in photoactive materials and principles of SPV measurements are combined with examples from research and development over the last two decades. SPV measurements with Kelvin probes, fixed capacitors, electron beams and photoelectrons are explained. Details are given for continuous, modulated and transient SPV spectroscopy. Simulation principles of SPV signals by random walks are introduced and applied for small systems. Application examples are selected for the characterization of silicon surfaces, gallium arsenide layers, electronic states in colloidal quantum dots, transport phenomena in metal oxides and local charge separation across photocatalytic active crystallites. Sample Chapter(s) Preface Chapter 1: Light-Induced Charge Separation and Surface Photovoltage Contents: Preface About the Authors Symbols and Abbreviations Light-Induced Charge Separation and Surface Photoactive Measurement Techniques of Surface Photovoltage Signals Practical Aspects of Surface Photovoltage Measurements Random Walk Simulation of Surface Photovoltage Signals in Small Systems Selected Applications of Surface Photovoltage Techniques Bibliography Index Readership: Young researchers and PhD students interested in the characterization of electronic properties of photoactive materials.

Curve and Surface Reconstruction Algorithms with Mathematical Analysis

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Many applications in science and engineering require a digital model of a real physical object. Advanced scanning technology has made it possible to scan such objects and generate point samples on their boundaries. This book, first published in 2007, shows how to compute a digital model from this point sample. After developing the basics of sampling theory and its connections to various geometric and topological properties, the author describes a suite of algorithms that have been designed for the reconstruction problem, including algorithms for surface reconstruction from dense samples, from samples that are not adequately dense and from noisy samples. Voronoi- and Delaunay-based techniques, implicit surface-based methods and Morse theory-based methods are covered. Scientists and engineers working in drug design, medical imaging, CAD, GIS, and many other areas will benefit from this first book on the subject.

Surface and Thin Film Analysis 2002

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(特價599)Surface and Thin Film Analysis 2002 (JW) 3-527-30458-4 H.BUBERT 9783527304585