Analysis and Design of Analog Integrated Circuits (6版)

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【簡介】 【目錄】 Chapter 1 Models for Integrated-Circuit Active Devices Chapter 2 Bipolar, MOS, and BiCMOS Integrated-Circuit Technology Chapter 3 Single-Transistor and Multiple-Transistor Amplifiers Chapter 4 Current Mirrors, Active Loads, and References Chapter 5 Output Stages Chapter 6 Operational Amplifiers with Single-Ended Outputs Chapter 7 Frequency Response of Integrated Circuits Chapter 8 Feedback Chapter 9 Frequency Response and Stability of Feedback Amplifiers Chapter 10 Nonlinear Analog Circuits Chapter 11 Noise in Integrated Circuits Chapter 12 Fully Differential Operational Amplifiers

Integrated Diagnostics and Theranostics of Thyroid Diseas (1版)

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This open access book provides basic concepts on Integrated Diagnostics and Theranostics with special emphasis on different human thyroid diseases. Thyroid diseases are increasingly detected (incidentally in many cases) but are clinically negligible in a significant proportion of patients. Accordingly, it is urgent to move from the simple disease detection to a reliable disease characterization in order to concentrate efforts on patients in need of tailored disease management. The current scenario of in vitroand in vivo diagnostics, is fastly moving toward the Integrated Diagnostics (i.e. convergence of imaging, pathology and laboratory tests with advanced information technology). Furthermore, the integration of different information will aid clinicians to properly select treatments and stratify patients’ prognosis over time. Theranostics is a perfect paradigm of such integrated approach and radioiodine, indicated for benign and malignant thyroid disease management, was the first and is still the mostly used theranostic agent in medicine. Featuring basics concepts and clinical cases discussions the Atlas will be an invaluable tool for clinicians, laboratory specialists, imaging physicians and biomedical technologists involved in diagnosis and therapy of thyroid diseases.

Integrated Circuit Fabrication (1版)

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【簡介】 Master fundamental technologies for modern semiconductor integrated circuits with this definitive textbook. It includes an early introduction of a state-of-the-art CMOS process flow, exposes students to big-picture thinking from the outset, and encourages a practical integration mindset. Extensive use of process and TCAD simulation, using industry tools such as Silvaco Athena and Victory Process, provides students with deeper insight into physical principles, and prepares them for applying these tools in a real-world setting. Accessible framing assumes only a basic background in chemistry, physics and mathematics, providing a gentle introduction for students from a wide range of backgrounds; and over 450 figures (many in color), and more than 280 end-of-chapter problems, will support and cement student understanding. Accompanied by lecture slides and solutions for instructors, this is the ideal introduction to semiconductor technology for senior undergraduate and graduate students in electrical engineering, materials science and physics, and for semiconductor engineering professionals seeking an authoritative introductory reference. 【目錄】 Frontmatter 1 - Historical Perspective, Moore’s Law and Future Technology Prospects pp 1-36 2 - Modern Complementary Metal-Oxide–Semiconductor (CMOS) Technology pp 37-69 3 - Semiconductor Materials: Crystal Growth, Wafer Preparation and Material Properties pp 70-110 4 - Semiconductor Manufacturing: Cleanrooms, Wafer Cleaning, Gettering and Chip Yield pp 111-158 5 - Lithography pp 159-254 6 - Semiconductor/Insulator Interfaces pp 255-309 7 - Doping in Semiconductors pp 310-379 8 - Ion Implantation pp 380-447 9 - Etching Technologies and Chemical–Mechanical Polishing pp 448-502 10 - Deposition Technologies pp 503-550 11 - Back-End (Interconnect) Processing Technologies pp 551-618 Appendices pp 619-656 A.1 - Basics of Semiconductor Materials in Equilibrium pp 619-640 A.2 - Standard Prefixes pp 641-641 A.3 - Useful Conversions pp 642-642 A.4 - Physical Constants pp 643-643 A.5 - Physical Properties of Silicon pp 644-644 A.6 - Properties of Insulators Used in Semiconductor Technology pp 645-645 A.7 - Color Chart for Thermally Grown SiO2 Films Observed Perpendicularly under Daylight Fluorescent Lighting pp 646-646 A.8 - Irvin Curves pp 647-648 A.9 - Error Function pp 649-652 A.10 - List of Important Symbols pp 653-653 A.11 - List of Common Acronyms pp 654-656 Index pp 657-662