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(全新特價只有1本) 書名：Discover Signal Processing: An Ineractive Guide For Engineers 作者：BRAUN 出版社：WILEY 出版日期：2008/03/00 ISBN：9780470519707
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Discover Signal Processing: An Interactive Guide for Engineers 2008<JW> 978-0-047-051970-7
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詳細資訊
(全新特價只有1本) 書名：Discover Signal Processing: An Ineractive Guide For Engineers 作者：BRAUN 出版社：WILEY 出版日期：2008/03/00 ISBN：9780470519707
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Flash Memories ISBN： 0792384873 類別： 電子/電機工程Electrical / Electronic Engineering 出版社： KLUWER ACADEMIC PUBLISHERS 作者： CAPPELLETTI 年份： 1999 裝訂別： 精裝 頁數： 556頁 內容簡介 About this book Most of the current applications of electronics require non-volatile memories, which can keep stored information when the power supply is switched off. Flash memories (in which a single cell can be electrically programmed and a large number of cells are usually electrically erased at the same time) are the most versatile non-volatile memories. They are widely used to store the basic input-output system (BIOS) of personal computers, the software and personal data of cellular phones, identification codes in smart cards and many other applications. Flash memories allow software updates, change of passwords and codes, and reconfiguration of the system in the field. They can be designed and optimized to create large-size memories which can successfully substitute hard disks for specific applications, having lower power consumption and weight, shorter access times, and far better robustness. This book is devoted entirely to flash memories and has been designed to provide comprehensive information on basic memory cell structures, device physics and technology, simulation circuit architecture, system issues, testing and reliability. It also provides data on advanced subjects related to multi-level storage cells, embedded memories and system applications of flash memories. Table of contents 1. Flash Memories: an Overview; P. Olivo, E. Zanoni. 2. The Industry Standard Flash Memory Cell; P. Pavan,R. Bez. 3. Binary and Multilevel Flash Cells; B. Eitan, A. Roy. 4. Physical Aspects of Cell Operation and Reliability; L. Selmi, C. Fiegna. 5. Memory Architecture and Related Issues; M. Branchetti, et al. 6.Multilevel Flash Memories; G. Torelli, et al. 7. Flash Memory Reliability; P. Cappelletti, A. Modelli. 8. Flash Memory Testing; G. Casagrande. 9. Flash Memories: Market, Marketing and Economic Challenges; B. Beverina, et al.
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