Reliability Wearout Mechanisms in Advanced CMOS Technologies 2009 <JW> 978-0-471-73172-6
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書名：Reliability Wearout Mechanisms in Advanced CMOS Technologies 2009 <JW> 978-0-471-73172-6
作者：Alvin W. Strong
出版社：JOHN WILEY & SONS Pte. Ltd.
出版日期：2009-12
ISBN：9780471731726
